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Power Electronics – Thermal Characterisation and Reliability

December 8, 2015

“Power Electronics – Thermal Characterisation & Reliability” – at the University of Nottingham, Tuesday 15th December 2015

You are invited  to spend the day with the University of Nottingham learning about the latest measurement system for fast, accurate, automated power cycling of power electronics components (MOSFETS, IGBTs, etc.) with integral thermal stack characterisation to track cause and effect for failure analysis. There will be presentations from the University of Nottingham and Mentor Graphics plus a lab tour, including a demonstration of the MicReD Power Tester 1500A.

This one day event is offered free of charge and complimentary refreshments and lunch are provided.  To reserve your place, please register today by following the link below – numbers are limited and availability is on a first come, first served basis!


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