Skip to content

Power Electronics – Thermal Characterisation and Reliability

December 8, 2015

“Power Electronics – Thermal Characterisation & Reliability” – at the University of Nottingham, Tuesday 15th December 2015

You are invited  to spend the day with the University of Nottingham learning about the latest measurement system for fast, accurate, automated power cycling of power electronics components (MOSFETS, IGBTs, etc.) with integral thermal stack characterisation to track cause and effect for failure analysis. There will be presentations from the University of Nottingham and Mentor Graphics plus a lab tour, including a demonstration of the MicReD Power Tester 1500A.

This one day event is offered free of charge and complimentary refreshments and lunch are provided.  To reserve your place, please register today by following the link below – numbers are limited and availability is on a first come, first served basis!

http://store.nottingham.ac.uk/browse/extra_info.asp?compid=1&modid=2&deptid=9&catid=6&prodid=612

Advertisements

From → News

Leave a Comment

Leave a Reply

Fill in your details below or click an icon to log in:

WordPress.com Logo

You are commenting using your WordPress.com account. Log Out / Change )

Twitter picture

You are commenting using your Twitter account. Log Out / Change )

Facebook photo

You are commenting using your Facebook account. Log Out / Change )

Google+ photo

You are commenting using your Google+ account. Log Out / Change )

Connecting to %s

%d bloggers like this: